GWACHEON, South Korea, Sept. 10. 2026– Park Systems Corp., a leading provider of atomic force microscopy (AFM) and nanometrology solutions, opened the 2026 NANOscientific Symposium (NSS) series with NSS Korea, bringing nearly 200 researchers and industry professionals to the new Park Systems headquarters in Gwacheon on Aug. 20–21. held concurrently with the 3rd Park Systems Korea User Meeting.
NSS Korea reflected the expanding scope of nanoscale research and measurement. While AFM remains at the core of the NANOscientific community, this year’s program expanded into artificial intelligence, semiconductor metrology, nanoscale infrared spectroscopy, optical measurement and advanced packaging. NSS Korea is the first of five regional symposiums in the 2026 global NSS series — which drew more than 700 participants worldwide in 2025 — and continues this year in Prague, Boston, Kuala Lumpur and Tokyo.
A central theme at NSS Korea was the growing convergence of artificial intelligence with nanoscale measurement. Day one opened with a keynote from Dr. Byung-Ho Lee, Executive Vice President at Park Systems and former Fellow at SK hynix, who framed a shift now underway across the semiconductor industry: as device architectures move from two-dimensional to more complex three-dimensional structures, artificial intelligence and deep learning are becoming as central to metrology and inspection (MI) as they are to device design itself.
Prof. Yunseok Kim of Sungkyunkwan University demonstrated an AI-driven AFM workflow using the Park FX40. applying machine learning-based segmentation and sparse sampling to reconstruct high-quality piezoresponse force microscopy images, illustrating the potential to accelerate nanoscale characterization while preserving quantitative information.
Nanoscale infrared characterization using photo-induced force microscopy (PiFM) was another major focus of the morning session. Prof. Hyo Jung Kim of Pusan National University presented a cross-sectional PiFM study using the Park FX200 IR to map crystal alignment in perovskite solar cell absorber layers, work published earlier this year in Advanced Energy Materials. Two additional talks traced PiFM from its fundamental physics to applications in plasmonic nanostructures, underscoring the research foundation behind Park Systems’ expanding nano-IR lineup, including its newly launched FX40 IR.
Semiconductor manufacturing and advanced packaging also featured prominently, with Samsung Electronics and SK hynix addressing emerging requirements for surface topography, overlay, and defect inspection in high-bandwidth memory (HBM), 3D integrated circuits, and panel-level packaging. Park Systems’ own presentation addressed the company’s growing Industrial AFM portfolio for advanced packaging applications.
Together, the presentations illustrated a broader shift in nanometrology: increasingly complex materials and device architectures require measurement technologies that combine nanoscale resolution with automation, data analysis, chemical characterization, and high-throughput inspection.
The second day featured hands-on demonstrations across Research AFM, Industrial AFM, nano-IR, and optical measurement technologies, covering applications from atomic-scale lattice imaging and electrical characterization to nanoscale infrared analysis, automated wafer metrology, and optical surface measurement.
“NSS Korea has grown alongside the researchers who attend it. Expanding this year’s program beyond AFM reflects where the science is actually heading, and where our customers are asking us to go with them,” said YG Lee, General Manager of Domestic Business Unit, Park Systems.
The 2026 NANOscientific Symposium Series continues at Charles University in Prague, Czech Republic (Sept. 9–11), Northeastern University in Boston, USA (Sept. 29–30), the University of Malaya in Kuala Lumpur, Malaysia (Oct. 14), and the University of Tokyo in Japan (Oct. 29).
Through the global series, Park Systems and the NANOscientific community bring together researchers, institutions, and technology leaders across disciplines to exchange ideas and address emerging challenges in nanoscale measurement.
About Park Systems
Park Systems is a global leader in nanometrology, providing advanced measurement solutions for research and industrial applications. Founded by Dr. Sang-il Park, a contributor to the invention of atomic force microscopy (AFM) at Stanford University, the company has grown through continuous innovation and strategic acquisitions. Its technology portfolio includes AFM, white light interferometry (WLI), digital holographic microscopy (DHM), imaging spectroscopic ellipsometry (ISE), active vibration isolation systems, and solid metal probes.
About NANOscientific
NANOscientific is a global community platform connecting researchers, engineers, and industry leaders in nanoscale science and metrology. Through the NANOscientific Symposium Series and NANOscientific Magazine, it promotes scientific exchange, interdisciplinary collaboration, and the advancement of nanoscale measurement worldwide.